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mirror of synced 2024-12-01 02:37:18 +01:00

tests: Fixed compiling of bitfield test

This commit is contained in:
WerWolv 2022-01-12 09:17:14 +01:00
parent 8d3ca3292e
commit 63edfb8d52

View File

@ -10,10 +10,10 @@ namespace hex::test {
auto testBitfield = create<PatternDataBitfield>("TestBitfield", "testBitfield", 0x12, (4 * 4) / 8, nullptr); auto testBitfield = create<PatternDataBitfield>("TestBitfield", "testBitfield", 0x12, (4 * 4) / 8, nullptr);
testBitfield->setEndian(std::endian::big); testBitfield->setEndian(std::endian::big);
testBitfield->setFields({ testBitfield->setFields({
create<PatternDataBitfieldField>("", "a", 0x12, 0, 4, nullptr), create<PatternDataBitfieldField>("", "a", 0x12, 0, 4, testBitfield, nullptr),
create<PatternDataBitfieldField>("", "b", 0x12, 4, 4, nullptr), create<PatternDataBitfieldField>("", "b", 0x12, 4, 4, testBitfield, nullptr),
create<PatternDataBitfieldField>("", "c", 0x12, 8, 4, nullptr), create<PatternDataBitfieldField>("", "c", 0x12, 8, 4, testBitfield, nullptr),
create<PatternDataBitfieldField>("", "d", 0x12, 12, 4, nullptr) create<PatternDataBitfieldField>("", "d", 0x12, 12, 4, testBitfield, nullptr)
}); });
addPattern(testBitfield); addPattern(testBitfield);