tests: Fixed compiling of bitfield test
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8d3ca3292e
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@ -10,10 +10,10 @@ namespace hex::test {
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auto testBitfield = create<PatternDataBitfield>("TestBitfield", "testBitfield", 0x12, (4 * 4) / 8, nullptr);
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auto testBitfield = create<PatternDataBitfield>("TestBitfield", "testBitfield", 0x12, (4 * 4) / 8, nullptr);
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testBitfield->setEndian(std::endian::big);
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testBitfield->setEndian(std::endian::big);
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testBitfield->setFields({
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testBitfield->setFields({
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create<PatternDataBitfieldField>("", "a", 0x12, 0, 4, nullptr),
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create<PatternDataBitfieldField>("", "a", 0x12, 0, 4, testBitfield, nullptr),
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create<PatternDataBitfieldField>("", "b", 0x12, 4, 4, nullptr),
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create<PatternDataBitfieldField>("", "b", 0x12, 4, 4, testBitfield, nullptr),
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create<PatternDataBitfieldField>("", "c", 0x12, 8, 4, nullptr),
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create<PatternDataBitfieldField>("", "c", 0x12, 8, 4, testBitfield, nullptr),
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create<PatternDataBitfieldField>("", "d", 0x12, 12, 4, nullptr)
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create<PatternDataBitfieldField>("", "d", 0x12, 12, 4, testBitfield, nullptr)
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});
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});
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addPattern(testBitfield);
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addPattern(testBitfield);
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